Abstract
Adaptive optics (AO) techniques enhance the capability of optical microscopy through precise control of wavefront modulations to compensate phase aberrations and improves image quality. However, the aberration correction is often limited due to the lack of dynamic range in existing calibration methods, such as interferometry or Shack-Hartmann (SH) wavefront sensors. Here, we use deflectometry (DF) as a calibration method for a deformable mirror (DM) to extend the available range of aberration correction. We characterised the dynamic range and accuracy of the DF-based calibration of DMs depending on the spatial frequency of the test pattern used in DF. We also demonstrated the capability of large magnitude phase control for remote-focusing over a range larger than was possible with SH sensing.
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