Abstract
Data included in this article are associated with the research article entitled ‘Protocol of single cells preparation for time-of-flight secondary ion mass spectrometry’ (Bobrowska et al., 2016 in press) [1]. This data file contains topography images of single melanoma cells recorded using atomic force microscopy (AFM). Single cells cultured on glass surface were subjected to the proposed sample preparation protocol applied to prepare biological samples for time-of-flight secondary ion mass spectrometry (ToF SIMS) measurements. AFM images were collected step-by-step for the single cell, after each step of the proposed preparation protocol. It consists of four main parts: (i) paraformaldehyde fixation, (ii) salt removal, (iii) dehydrating, and (iv) sample drying. In total 13 steps are required, starting from imaging of a living cell in a culture medium and ending up at images of a dried cell in the air. The protocol was applied to melanoma cells from two cell lines, namely, WM115 melanoma cells originated from primary melanoma site and WM266-4 ones being the metastasis of WM115 cells to skin.
Highlights
Data on step-by-step atomic force microscopy monitoring of changes occurring in single melanoma cells undergoing ToF SIMS specialized sample preparation protocol
The protocol was applied to melanoma cells from two cell lines, namely, WM115 melanoma cells originated from primary melanoma site and WM266-4 ones being the metastasis of WM115 cells to skin
Surface images recorded by Xe120 system Analyzed Living melanoma cells were cultured on the glass coverslips, placed in a Petri dish, and immersed in a culture medium
Summary
Surface images (topography and deflection modes and 3D representation of topography) recorded by Xe120 system (saved originally in tiff format) Analyzed Living melanoma cells were cultured on the glass coverslips, placed in a Petri dish, and immersed in a culture medium Such samples were further used for the AFM measurements. The data presented below, show an exemplary sequence of the surface topography and deflection (“error”) images (a & b) recorded using an atomic force microscope (model: Xe120, from Park Systems, Korea) for a single cell after each step of the applied ToF SIMS specific sample preparation protocol, accompanied by a 3D representation of a cell surface (c). The AFM images presented below, show surface changes of single WM266-4 cells acquired after each step of the ToF SIMS specialized sample preparation protocol. The presented protocol enables to record mass spectra (ToF SIMS) on single cells [1,2] (Figs. 2.1–2.13)
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