Abstract
High angle annular dark field scanning transmission electron microscope (HAADF-STEM) imaging and quantitative energy-dispersive X-ray spectroscopy (EDX) analysis was used to elucidate the Cu segregation on the interface between Al2O3 substrate and Al-1.4Cu alloy. A significant Cu segregation (about 2at%) was observed, which can be mainly attributed to the enhanced diffusion caused by the high strain between Al2O3 substrate and Al-1.4Cu alloy. This investigation highlights the importance of Cu segregation and subsequent eutectic reaction on the heterogeneous nucleation of Al on Al2O3 substrate.
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