Abstract

In this study, polycrystalline Cu-foil substrates are exposed to elemental Te vapor at substrate temperatures below 373 K. Auger electron spectroscopy measurements indicate that copper-telluride films are formed at the substrate surface that have a 2:1 Cu-to-Te ratio, as predicted by the Cu–Te phase diagram. When these films are annealed above about 700 K in vacuum, Te desorbs from the substrate with zero-order kinetics. An analysis of Te-desorption traces that assumes the reaction Cu 2Te( s) → 2Cu( s) + αTe( ν) + 1/2(1 − α)Te 2( ν) finds a thermal-decomposition activation energy of 217 ± 3 kJ mol − 1 . These Te-desorption data are compared to the Te impingement rate calculated from Cu 2Te equilibrium vapor-pressure data from the literature and found to be in excellent agreement.

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