Crystal Growth, Optical, Mechanical and Dielectric Analysis of Semiorganic Glycine Manganese Sulphate Single Crystal for Opto‐Electronic Device Application

Abstract

AbstractGlycine manganese sulphate (GMS) crystals are produced by a slow evaporation technique at room temperature. This is confirmed that triclinic of the crystal lattice system by using single crystal X‐ray diffraction analysis and to determine the lattice parameters of the synthesised crystals. Powder XRD is used to confirm the planar indexing and crystalline structure. The Fourier Transform Infrared (FT‐IR) spectra are examined to verify that functional groups are present in the generated GMS crystals. By establishing a cut‐off wavelength of 253 nm, spectra of visible, near‐infrared, and Ultra Violet (UV) light from 200 to 1100 nm are analyzed. At frequencies ranging from 100 Hz to 8 MHz, the grown crystal's dielectric response is studied. Vickers microhardness tester is utilized to find out how strong the grown crystal is mechanically. Photoluminescence (PL) investigations often aim to detect crystal formation faults and contaminants. Etching analysis is used to find surface flaws and dislocations on the formed crystal's surface. The internal surface property of the produced crystal is investigated with scanning electron microscopy (SEM). The findings contradicted each other, suggesting that the created GMS crystal be used in opto‐electronic device applications.