Abstract
A new probe for acquiring ESR images with microscopic resolution and high spin sensitivity, at a temperature range of ∼4.2–300K, is presented. Details of the probe design, as well as its principle of operation, are provided. The probe incorporates a unique surface loop-gap microresonator. Experimental results demonstrate the system’s capability to acquire two – as well as three-dimensional images with a flat test sample of phosphorus-doped silicon. The imaging results also allow verifying the resonator’s resonance mode – they show its B1 distribution, which also makes it possible to estimate the number of spins measured in the sample.
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