Abstract
Zn3As2 films of varying thicknesses were grown on a variety of substrates. Scanning electron microscopy analysis of surface morphology revealed cracks in the film–substrate combinations for thicker epilayers. Theoretical calculations of critical layer thicknesses when cracking will occur, based on nucleation theories, fail to adequately explain the origin of the cracks. Furthermore, strain present in the overgrowth, due to the thermal mismatch with the substrates, is not large enough to cause cracking, despite the fact that empirical evidence favours this mechanism. It is likely that a combination of lattice and thermal mismatch is the reason for the formation of the cracks.
Published Version
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