Abstract
Experiments on single electron tunneling effects induced by the Coulomb blockade in small capacitance tunnel junctions are described. The tunnel junctions are of the point contact type, produced by means of scanning tunneling microscope techniques. Both single junctions and double junctions have been studied. The observed behaviour is compared with calculations based on Monte Carlo simulations.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
