Abstract

Correspondence: On the nature of strong piezoelectricity in graphene on SiO2.

Highlights

  • In a recent article published in Nature Communications, da Cunha Rodrigues et al.[1] used both methods to investigate single-layer graphene deposited on SiO2 grating substrates

  • Raman shifts into strain values, the authors assume that the strain is of uniaxial nature and use a Gruneisen parameter of DoG/De 1⁄4 À 49.3 cm À 1 1⁄4 À 0.493 cm À 1/%

  • The extracted strain values are reduced by a further factor of 3 if one uses a Gruneisen parameter of À 69.1 cm À 1/%, as previously measured for biaxial strain[5], which would result in an in-plane strain of 0.02–0.03% only

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Summary

Introduction

In a recent article published in Nature Communications, da Cunha Rodrigues et al.[1] used both methods to investigate single-layer graphene deposited on SiO2 grating substrates. Raman shifts into strain values, the authors assume that the strain is of uniaxial nature and use a Gruneisen parameter of DoG/De 1⁄4 À 49.3 cm À 1 1⁄4 À 0.493 cm À 1/% (see page 6 in Supplementary Note 1 of da Cunha Rodrigues et al.[1]). By using the correct units, this leads to strain values which are exactly a factor 100 smaller than what has been claimed by the authors.

Results
Conclusion

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