Abstract
Microwave dielectric properties of Ba(Mg1/3Ta2/3)O3-series materials were investigated using Fourier transform infrared spectroscopy (FTIR) and Raman spectroscopy. The normal vibration modes of these spectra were assigned, and the origin of dielectric response of the materials was deduced. Among the prominent normal vibration modes in the FTIR spectra, those which correlated with O-layers and Ba-layers change with Sr-ratio most significantly, whereas in micro-Raman measurements, the A1g(O) phonon of oxygen-octahedron stretch mode changes with Sr-ratio most profoundly. These results reveal clearly the close relationship between the characteristics of FTIR and Raman spectra of the BMT-series materials and their microwave dielectric properties.
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