Abstract
We study the correlations between the driving signal reflection on the traveling wave electrodes and the modulated signal characteristics of silicon Mach-Zehnder modulators (MZM). Correlation coefficients are introduced for systematic and quantitative analysis. The signal-to-noise ratio, extinction ratio, and bit error rate show similar correlation behaviors with the mean reflection magnitude over proper frequency ranges, whereas the correlation behaviors of the temporal parameters can be complex. Partial correlation coefficients can be introduced to help remove the influence of other factors. Some relevant fabrication variation scenarios in the underlying structures are discussed, and potential approaches to mitigating the effects of such variations are suggested.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
