Corrections of spectral interferences by a sequential inductively coupled plasma spectrometer with an intelligent wavelength calibrating device

Abstract

The characteristics of a sequential inductively coupled plasma spectrometer with an intelligent wavelength calibrating device (ICP-IWC) used to correct spectral interferences were investigated and compared with that of a very old multi-channel inductively coupled plasma atomic emission spectrometry (ICP-AES). The computer intelligent wavelength-calibrating program used in this sequential ICP-IWC spectrometer is discussed. The analytical results of eight elemental components of a basic slag standard after spectral interference correction using this instrument are in good agreement with the certified values and those by the line-profile method. The system does not require 8–10 h pre-heating as needed with a local thermostat or profiles for every analytical line as in the line-profile method, which indicates that the sequential ICP-IWC spectrometer can avoid and correct the spectral interferences effectively by choosing the analytical lines properly and finding the peaks of the analytical lines precisely. The flexibility of choosing spectral lines is a common merit of all kinds of modern sequential ICPs, but the high accuracy of finding out the peaks of spectral lines without the need of a local thermostat or the line-profile method is the unique merit of the sequential ICP-IWC. It has been proven possible to use the intelligent wavelength calibrating device in the sequential ICP spectrometer instead of a traditional local thermostat or the line-profile method. The instrument has proven to be quite effective, with the features of time-saving, safety, simple structure as well as the prospects of widespread applications.