Abstract
Two zone axis pattern (ZAP) maps were obtained from a copper single crystal, using convergent beam electron diffraction in a transmission electron microscope: the Kossel pattern (KP) and the convergent beam electron diffraction (CBED) pattern ZAP map. A computer simulation of the KP map was used to aid its interpretation. The CBED ZAP map of copper consists of zero layer disks showing an intersecting set of higher-order Laue zone (HOLZ) deficiency lines. From the computer simulations of these disks, an operating high voltage of 84kV was determined. Both kinds of map are useful for subsequent “fingerprint” identification of copper in precipitates, alloy crystalline phases, and crystallographic direction determination.
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