Abstract
This study systematically investigated the electronic, structural, and optical properties of MgTiO3 (MTO), LaNiO3 (LNO), and MgTiO3/LaNiO3 (MTO/LNO) nanostructured films grown on Si(100) substrates by the pulsed laser deposition method. The structural characterizations obtained by X-ray diffraction revealed a preferred (003) orientation for the MTO film, while the LNO film was polycrystalline. The diffraction peaks corresponded to a rhombohedral structure, which was confirmed by micro-Raman spectroscopy for both nanostructured films. The MTO/LNO heterostructure was polycrystalline and exhibited the diffraction peaks of both the MTO and the LNO phases. Additionally, the results revealed that the LNO films did not have a significant photoluminescence (PL) emission, while an intense broad infrared luminescence centered at 724 nm appeared for the MTO nanostructured film. Surprisingly, for the MTO/LNO heterostructure, the PL emission profile exhibited a dual-color emission with an intense broad luminescence in...
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