Abstract

Coatings or films are applied to a substrate for several applications, such as waterproofing, corrosion resistance, adhesion performance, cosmetic effects, and optical coatings. When applying a coating to a substrate, it is vital to monitor the coating thickness during the coating process to achieve a product to the desired specification via real time production control. There are several different coating thickness measurement methods that can be used, either in-line or off-line, which can determine the coating thickness relative to the material of the coating and the substrate. In-line coating thickness measurement methods are often very difficult to design and implement due to the nature of the harsh environmental conditions of typical production processes and the speed at which the process is run. This paper addresses the current and novel coating thickness methodologies for application to chromium coatings on a ferro-magnetic steel substrate with their advantages and limitations regarding in-line measurement. The most common in-line coating thickness measurement method utilized within the steel packaging industry is the X-ray Fluorescence (XRF) method, but these systems can become costly when implemented for a wide packaging product and pose health and safety concerns due to its ionizing radiation. As technology advances, nanometer-scale coatings are becoming more common, and here three methods are highlighted, which have been used extensively in other industries (with several variants in their design) which can potentially measure coatings of nanometer thickness in a production line, precisely, safely, and do so in a non-contact and non-destructive manner. These methods are optical reflectometry, ellipsometry and interferometry.

Highlights

  • This review emerges from a requirement to measure chromium coatings on a steel substrate passing through a production line running at full speed, which can be more than 6 m s−1

  • Each method outlined within this paper has been categorized into their potential for: continuous, non-contact, non-destructive, in-line measurement; at speed of sub 50 nm coating thickness measurement of applicable substrate/coating material combinations

  • There are other novel methodologies which may satisfy this application requirements such as a thermoelectric method with a magnetic readout approach, Terahertz Time Domain Spectroscopy (THz-TDS), Confocal Microscopy (CCM), and infrared thermography; there is very little research regarding these methods for nano-scale precision

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Summary

Introduction

This review emerges from a requirement to measure chromium coatings on a steel substrate passing through a production line running at full speed, which can be more than 6 m s−1 For this application, metallic chromium (Cr) is electroplated onto both the top and bottom surfaces of a stainless-steel substrate in a series of chromium baths, this layer passivates to form a chromium oxide (Cr2 O3 ) layer. Metallic chromium (Cr) is electroplated onto both the top and bottom surfaces of a stainless-steel substrate in a series of chromium baths, this layer passivates to form a chromium oxide (Cr2 O3 ) layer This product is widely known as ECCS or TFS, and its primary function is for the steel packaging industry.

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