Abstract
Bhattacharyya and Soejoeti (1989) put forward the tampered failure rate model (TFR Model) for step-stress Accelerated Life Tests(ALT). This paper studies the conditions for the coincidence of the TRV, TFR and CE models, gives the definitions of the coincidence, offers a proof of the necessary and sufficient condition for the coincidence of the TRV and TFR models in [1], and points out a mistake that appeared in the counterexample provided in [3].
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