Abstract
Kikuchi diffraction patterns provide valuable information about the diffraction contrast images observed in TEM of crystals. For example, the “critical voltage” phenomenon of vanishing 2nd order Bragg reflection and the marked changes in transmission and contrast behavior above 100 kv due to increased many-beam systematic interactions are reflected in the K-patterns. New developments on a method for predicting both conventional (2-beam) and many-beam K-patterns and on CRT image simulation of the results will be discussed.Kikuchi patterns are formed by diffraction of electrons that have been diffused within the crystal by inelastic scattering from a parallel incident beam. For simplicity, however, we consider diffraction from a diffuse incident beam of appropriate angular distribution and use the reciprocity theorem of optics to relate the intensities in diffuse-beam diffraction to those in parallel beam diffraction. This allows the K-patterns to be calculated from many-beam dynamical theory of diffraction including absorption developed for TEM.
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