Abstract
In order to perform quantitative image-contrast analysis of low-contrast electron micrographs one must first increase the signal to noise ratio. As an example, consider the weak-beam method of imaging defects by transmission electron microscopy. In this technique an increase in the resolution of closely spaced dislocations is obtained through a narrowing of the individual dislocation image widths. However, this reduction in image width is accompanied by a corresponding decrease in the signal to noise ratio, which in many instances renders quantitative image-contrast analysis impractical. In this note we present an example of the computer image enhancement of a weak-beam micrograph.
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