Abstract
By developing Lommel's Bessel integration with respect to the Gaussian scattering angular distribution, the Kirchhoff diffraction integrals indicating image profiles of atom clusters in high resolution electron microscopy, when taking account of the complex scattering amplitude and optical phase of the objective lens aberrations, can be performed as functions of the generalized spatial frequency, image distance and defocusing. The light optical diffractograms obtained by the Fourier-Bessel transformation; which involves the coherent wave consisting of both phase and amplitude contrast transfer functions, as well as the incoherent wave consisting of square terms; provide a useful method of measuring the aberration coefficients, scattering factor phase and the exact amount of defocus. It follows that the image contrast of clusters can be reconstructed from the diffractograms by evaluating the spatial frequencies and scattering factor phases of individual clusters with the aid of digital computer calculations in place of the previous Monte-Carlo method.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
