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Abstract
Composition-dependent ferroelectric behavior in <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mrow><mml:mi mathvariant="normal">Z</mml:mi><mml:msub><mml:mi mathvariant="normal">n</mml:mi><mml:mrow><mml:mn>1</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub><mml:mi mathvariant="normal">M</mml:mi><mml:msub><mml:mi mathvariant="normal">g</mml:mi><mml:mi>x</mml:mi></mml:msub><mml:mi mathvariant="normal">O</mml:mi></mml:mrow></mml:math> thin films
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