Abstract

Lithium insertion into amorphous films prepared by the electron beam evaporation technique was investigated by measurements of voltage-composition curve and chemical diffusion coefficient. The extraction of equilibrium and kinetic parameters allows the determination of the jump diffusion coefficient dependence on composition. In addition, first-principles calculations combining a pseudopotential plane wave scheme have been performed with the aim of providing a better understanding of the dependence of the potential barrier height for the hopping pathway with the insertion level for crystalline compounds. Our results predict a lowering of the barrier height for less doped systems and both experiments and simulations exhibit a relation of the type for the composition range .

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