Abstract
<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> In this paper, we show that the differential noise figure of differential amplifiers is better measured directly by using baluns rather than be derived from single-ended measurements. For on-wafer measurements at 60 GHz, this can best be done using RF probes with integrated baluns. To extract the full 4<formula formulatype="inline"><tex Notation="TeX">$\,\times\,$</tex></formula>4 noise correlation matrix needed to predict the circuit behavior under any operating condition, this needs to be extended with at least one single-ended noise-figure measurement taken on an individual amplifier. For the experimental two-stage differential amplifier realized in 45-nm node CMOS studied in this paper, we found a noise figure of 3.2 dB. This is, to the best of our knowledge, the lowest noise figure reported at 60 GHz in any CMOS technology thus far. </para>
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