Abstract

A comparison of transmission electron microscopy (TEM) and atom probe field-ion microscopy (APFIM) is presented with respect to the interpretation of complex microstructures, phase identification, determination of crystallographic order, and analysis of interfaces. The capabilities, spatial resolutions, and limitations of each technique are discussed with examples taken from combined analytical electron microscopy (AEM) and APFIM studies. Both techniques are extremely powerful for routine characterization of a wide range of materials, although care must be exercised in experimentation and interpretation. The combined use of TEM and APFIM is synergistic and extends their individual capabilities from the macro scale to the atomic level.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.