Abstract

The electrical properties of plane field-effect transistors with different assumed impurity-atom distributions in their channel regions, corresponding to either an alloyed- or a diffused-gate p-n junction, are compared with those of the cylindrical type, with a uniform distribution of impurities in the channel. It is shown that the electrical properties of different types of field-effect transistors with the same pinchoff voltage and transconductance are quite similar.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.