Abstract
Examination was made of the optimum performance of thermal ionization, fieldionization and electron ionization sources, using permalloy (Ni81Fe19)and aluminium as source materials. Discussion is made of the possible use of theseto give direct deposition sources, for low-cost nanoscale device production.Fabrication of field emitter tips using focused ion beam milling was used to try toenhance the ion emission current of field ionization sources. Electron ionizationproduced the largest ion current, but field ionization gave enhanced stability.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
