Abstract
Symbolic and genetic techniques are combined in a new approach to sequential circuit test generation that uses circuit decomposition, rather than the algorithmic decomposition used in previous hybrid test generators. Symbolic techniques are used to generate test sequences for the control logic, and genetic algorithms are used to generate sequences for the datapath. The combined sequences provide higher fault coverages than those generated by existing deterministic and GA-based test generators, and execution times are significantly lower in many cases.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
