Abstract
Characterization of photovoltaic (PV) module materials throughout different stages of service life is crucial to understanding and improving the durability of these materials. Currently the large-scale of PV modules (>1 m2) is imbalanced with the small-scale of most materials characterization tools (≤1 cm2). Furthermore, understanding degradation mechanisms often requires a combination of multiple characterization techniques. Here, we present adaptations of three standard materials characterization techniques to enable mapping characterization over moderate sample areas (≥25 cm2). Contact angle, ellipsometry, and UV-vis spectroscopy are each adapted and demonstrated on two representative samples: a commercial multifunctional coating for PV glass and an oxide combinatorial sample library. Best practices are discussed for adapting characterization techniques for large-area mapping and combining mapping information from multiple techniques.
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