Abstract
The existence of classical phase diffusion in hysteretic junctions is demonstrated by quantitative agreement between experimental and simulated {ital I}-{ital V} curves. The simulations are based on a circuit that accurately models both the junction and its external shunting impedance at microwave frequencies. We show that the bias current at which the junction switches from the phase diffusion state to the voltage state is sensitive to dissipation at microwave frequencies.
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