Abstract
We report on the electrical transport properties of 45° asymmetrical grain boundaries (GB's) fabricated in YBa 2Cu 3O 7− x films grown by the liquid phase epitaxy (LPE). In total, about 15 samples have been studied. Similar to previous results obtained on bicrystals grown by various physical deposition (PVD) methods we found strong scattering of zero magnetic field critical current density. In striking contrast to PVD grown bicrystals selected LPE grown bicrystals demonstrate regular magnetic interference patterns suggesting better quality of the GB in LPE bicrystals compared to PVD samples.
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