Characterization of ZnO threads obtained using dip coating method at room temperature

Abstract

In this work ZnO thin films were prepared using the sol–gel method; these films have been deposited on glass substrates using the dip coating technique. The surface characteristics of the films were analyzed with atomic force microscope and could see that the morphology of these films was in thread forms. These threads are formed at the time of deposit of the sol–gel solution with the deep coating. After the heat treatment, these threads keep their shape. The structural characteristics of the films were analyzed using an X-ray diffractometer using the X-ray beam technique, we can found the wurtzite (ZnO) phase in our films and the crystallite sizes were calculated using Scherrer equation. The optical properties were studied by a UV–Visible spectrophotometer where we find that the transmittance percentage is over 50%. The band gap of ZnO films was found in 3.02 for the film with 1 layer and conform we increased the number of layers the optical band gap decrease.