Abstract
Abstract In order to develop superconducting thin films or multilayer structures suitable for Superconducting Flux Flow Transistors (SFFTs), we propose a model to describe the current–voltage characteristics measured on microbridges in the flux creep regime and we show how the effective superconducting thickness of the samples, as well as the pinning potential range, the maximum velocity, the pinning energy, and the depinning current of the vortices can be determined. This model is applied to YBCO microbridges in order to compare samples and to develop films which may easily be driven into the flux flow regime.
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