Abstract
Amplitude and phase measurements of the near-field generated by isolated subwavelength apertures in a gold film are presented. The near-field distribution of such a structure is complex and the measured signal strongly depends on the electric field components effectively detected by the experimental setup. By comparing this signal with 3D vectorial calculations we are able to determine which electric field components are effectively measured. The sensitivity of the phase distribution is key to this measurement. The proposed characterization technique should prove extremely useful to calibrate a Scanning near-field optical microscopy (SNOM) beforehand in order to retrieve quantitative information on the polarization of the field distribution under study.
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