Abstract
Thin YBa2Cu3O7−δ∕La0.67Ca0.33MnO3∕YBa2Cu3O7−δ (YBCO/LCMO/YBCO) trilayers on (001)-oriented SrTiO3 (STO) substrates were fabricated by magnetron sputtering technique. The trilayers are well c-axis oriented confirmed by x-ray diffraction. The surface and interface structure of the trilayers were investigated by grazing incident x-ray reflectivity. The results showed that there exists diffusion at the YBCO/LCMO interfaces with the diffusion length of several nanometers. The root-mean-square (rms) roughness of surface and interface in the trilayers varied with the thickness of YBCO layer. The rms roughness of surface was consistent with observation by atomic force microscopy. A further analysis indicated that the rms roughness was correlative to the misfit strain relaxation in film.
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