Abstract
Zinc telluride (ZnTe) layers have been grown on conducting glass substrates using an electrochemical technique and characterized using cyclic voltammetry, X-ray diffractions, UV–vis-near infrared spectroscopy, and scanning electron microscopy (SEM). The reaction kinetics of binary film formation is also discussed. Cyclic voltammetry experiments were performed to elucidate the electrodic processes that occurred when potentials were applied and the optimum potential for electrodeposition were determined. X-ray diffraction studies revealed that the deposited films were polycrystalline in nature with zinc blende cubic structure. The various microstructural parameters were calculated using structural studies. The optical transmission and reflection spectrum were recorded and direct transition band gap energy is estimated about 2.26 eV by Tauc’s plot. The SEM pictures revealed that the nanoneedles protruding from nanorods with bunches of atoms agglomerate each other. The energy dispersive analysis by X-rays spectrum revealed the stoichiometry composition of ZnTe thin film at optimized preparative parameters.
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