Abstract
光电校靶采用捷联惯导系统，需将惯导轴线用光电自准直系统表征捷联，用于对设备轴线的测量。光电自准直系统所表征的轴线与惯导轴线的一致性是影响校靶精度的重要因素，为提高光电校靶系统测量精度和效率，提出了一种惯导轴线的光电表征和校准方法。该方法是在分析测量结果偏差与一致性关系的基础上，采用实验数据拟合的方式得到自准直系统光轴与惯导轴之间的角度偏差值，用于系统修正，从而实现高精度校准。通过试验，将传统光机校正法和光电校准法结合使用，可大幅度提高系统校正效率，同时得到惯导与光轴一致性精度在15″以内。试验结果表明，与传统光学平晶引出的光机校正法相比，该方法的表征准确度和校准精度更高，适用于高精度惯性测量系统。
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