Characteristics of relaxor-based piezoelectric single crystals for ultrasonic transducers

Abstract

For ultrasonic transducers, piezoelectric ceramics offer a range of dielectric constants (K/spl sim/1000-5000), large piezoelectric coefficients (d/sub ij//spl sim/200-700 pC/N), and high electromechanical coupling (k/sub t//spl sime/50%, k/sub 33//spl sime/75%). For several decades, the material of choice has been polycrystalline ceramics based on the solid solution Pb(Zr/sub 1-x/B/sub 2x/)O/sub 3/ (PZT), compositionally engineered near the morphotropic phase boundary (MPB). The search for alternative MPB systems has led researchers to revisit relaxor-based materials with the general formula, Pb(B/sub 1/,B/sub 2/)O/sub 3/ (B/sub 1/:Zn/sup 2+/, Mg/sup 2+/, Sc/sup 3+/, Ni/sup 2+/..., B/sub 2/:Nb/sup 5+/ Ta/sup 5+/...). There are some claims of superior dielectric and piezoelectric performance compared to that of PZT materials. However, when the properties are examined relative to transition temperature (T/sub 3/), these differences are not significant. In the single crystal form, however, Relaxor-PT materials, represented by Pb(Zn/sub 1/3/Nb/sub 2/3/)O/sub 3/-PbTiO/sub 3/ (PZN-PT), Pb(Mg/sub 1/3/Nb/sub 2/3/)O/sub 3/-PbTiO/sub 3/ (PMN-PT) have been found to exhibit longitudinal coupling coefficients (k/sub 33/)>90%, thickness coupling (k/sub t/)>83%, dielectric constants ranging from 1000 to 5000 with low dielectric loss 2000 pC/N, the later promising for high energy density actuators. For single crystal piezoelectrics to become the next generation material of ultrasonic transducers, further investigation in crystal growth, device fabrication and testing are required.