Abstract
Photomodulated reflectance (PR) is a straightforward technique in which the semiconductor's reflectivity is perturbed by a chopped laser beam. In contrast to photo-luminescence, PR spectra are replete with sharp, detailed derivative-like features from ground-state, and other higher-energy transitions, from which can be extracted material parameters crucial to device operation, such as compositions, layer thicknesses, built-in electric fields and band line-ups. Since samples need no special mounting, can be studied in air at 300K, and can be full-sized prefabrication wafers, PR is truly non-destructive. We discuss the advances in the application and interpretation of PR spectra of vertical-cavity surface-emitting lasers and resonant-cavity light-emitting diodes, which are difficult to characterise using the more conventional non-destructive techniques.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
