Abstract
The widespread use of scanning probe microscopy (SPM) techniques has revolutionized many scientific and industrial fields, especially material science, by allowing the surface morphology to be visualized and the composition or properties of materials to be probed at the atomic or submolecular scale. Here, we review the recent innovations in SPM techniques applied to modern material science, from two-dimensional covalent supramolecular systems based on bottom-up nanotechnology to advanced material development for polymer electrolyte fuel cells and thin film solar. Among the variety of SPM methods, electrochemical scanning tunneling microscopy, atomic force microscopy, conductive atomic force microscopy, and Kelvin probe force microscopy are discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
