Abstract

Results of measurements of the electric field induced changes in the optical refractivity (Franz-Keldysh effect) of silicon at 95°K are presented in this paper. Silicon samples were irradiated by fast neutron flux in a reactor to increase resistivity. The 1.15 µ line of a Ne-He laser was deflected by a prism of silicon and the change in the angle of deflection with electric field was measured by an infrared vidicon. The measured change in refractive index is 1.7×10-3 at the electric field intensity of 5×104V/cm. Separations of the effect due to the Franz-Keldysh effect from the temperature effect and the electrostriction are discussed. Nonlinear effects of the Franz-Keldysh effect by the electric fields of the optical frequencies are also discussed.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.