Abstract
This paper presents a simple built-in current sensor (BICS) design for quiescent current (IDDQ) testing of CMOS data converter circuits. The proposed BICS works in two modes: the normal mode and the test mode. In the normal mode, the BICS is isolated from the circuit under test (CUT) due to which there is no performance degradation of the circuit. In the testing mode, the BICS detects the abnormal current caused by permanent manufacturing defects and has negligible impact on the performance of the circuit under test. The dynamic current of the CUT does not affect the BICS output. The BICS is operated from power supply voltages of the CUT using the current reference configuration. A 10-bit charge scaling digital-to-analog converter and a first-order modulator of an 8-bit sigma delta analog-to-digital converter have been designed in standard 1.5 μm CMOS and tested using the present BICS for injected faults simulating manufacturing defects. It is shown that significant improvement in testing of mixed signal integrated circuits has been achieved using a simple fault injection technique combined with the BICS.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
