CBED analysis of extended defects in melt-grown GaSe single crystals

Abstract

The study of dislocations and stacking faults in melt grown GaSe single crystals has been carried out by the Convergent Beam Electron Diffraction (CBED) technique.The presence of stacking faults induces distortions in the Kikuchi lines observed in the CBED transmitted disk. According to the kinematical condition of the stacking fault visibility, such lines show modifications when g·R is not integer, The displacement vector R has been determined by the analysis of the visibility and invisibility conditions in the transmitted disk, recorded according to the Tanaka method, The Burgers vector b of dislocations has been determined by the analysis of the modifications induced both in Kikuchi lines and in the First Order Laue Zone (FOLZ) reflections, observed in low camera length CBED patterns. Splitting and unsplitting of the reflections correspond to the visibility and invisibility of the dislocations in the kinematical approximation of diffraction contrast, The condition g·b = 0 is not strictly a sufficient condition for the vanishing of the modifications induced by the dislocation, neverthless it is generally very useful as a criterion for determining the direction of b, Moreover, some reflections g give g·b = ⅓ in the case of partial dislocations. This condition does not produce enough contrast to be detected, so that it is one more for the defect invisibility. The Thompson construction has been used in order to calculate the amplitude of b and to discriminate perfect or partial dislocations.