Abstract
In this work we introduce a new method, which employs commercial piezo-cantilevers, for a ferromagnetic resonance (FMR) detection from thin, nm-size, films. Our setup has an option to rotate the sample in the magnetic field and it operates up to the high microwave frequencies of 160GHz. Using our cantilever based FMR spectrometer we have investigated a set of samples, namely quasi-bulk and 84nm film Co2FeAl0.5Si0.5 samples, 16nm Fe50Ni50 film and 150nm Sr2FeMoO6 film. Low frequency and room temperature test of our setup using 84nm Co2FeAl0.5Si0.5 film yielded a result identical to a standard X-Band spectrometer, namely a single line with quite small linewidth. Our measurements at low temperatures and high frequencies revealed a quite strong FMR response detected in all samples. The FMR spectra share common features, such as the emergence of the second line with an opposite angular dependence, and a drastic increase of the linewidths with increasing microwave frequency. We believe that these findings are results of the complicated dynamics of the magnetization at low temperatures and high frequencies, which we were able to probe using our cantilever based FMR setup.
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