Abstract
In order to improve the precision of domain wall dynamics measurements, we develop a coplanar waveguide-based setup where the domain wall motion should be triggered by pulses of magnetic field. The latter are produced by the Oersted field of the waveguide as a current pulse travels toward its termination, where it is dissipated. Our objective is to eliminate a source of bias in domain wall speed estimation while optimizing the field amplitude. Here, we present implementations of this concept for magnetic force microscopy (MFM) and synchrotron-based investigation.
Highlights
M AGNETIC domain walls (DWs) have been discovered almost a century ago, yet their investigation has triggered a large research effort in recent years
The difficulty in unraveling the details of a DW’s dynamics lies in the fact that only a small number of techniques, such as stroboscopic X-ray magnetic circular dichroism (XMCD), can produce time-resolved imaging of DW structures during their motion, provided that the initial magnetic state and the subsequent motion can be repeated a very large number of times [5]. Another approach consists in performing static imaging of DWs before and after applying a pulse of magnetic field
The ratio of the traveled distance to the pulse duration yields an estimate of the average DW speed, which can be compared with the simulations
Summary
M AGNETIC domain walls (DWs) have been discovered almost a century ago, yet their investigation has triggered a large research effort in recent years. The difficulty in unraveling the details of a DW’s dynamics lies in the fact that only a small number of techniques, such as stroboscopic X-ray magnetic circular dichroism (XMCD), can produce time-resolved imaging of DW structures during their motion, provided that the initial magnetic state and the subsequent motion can be repeated a very large number of times [5] Another approach consists in performing static imaging of DWs before and after applying a pulse of magnetic field (or spin-polarized current). The use of a matching impedance at the end of the device dissipates the pulse, so that none of its power can be reflected, eliminating one possible bias Adaptation of this method for XMCD-photoemission electron microscopy (PEEM) and for magnetic force microscopy (MFM) are presented
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