Behaviour of silicon-doped CFC limiter under high heat load in TEXTOR-94

Abstract

In order to study the impurity production, recycling and power deposition a Si doped CFC test limiter (NS31) was used in TEXTOR-94. The release of impurities (C, Si, O, Cr, CD radicals) was measured spectroscopically. A reduced methane production was found in the Si doped graphite when compared to a pure graphite limiter. A smaller decrease of the carbon fluxes could also be observed. The limiter contained about 1%–1.5% of Si, but a relative Si flux (Si/D) from the Si doped CFC surface between 0.12% and 0.4% has been measured. A chemical erosion of Si due to formation of SiDx has not been observed. Silicon evaporated from the surface at temperatures above 1500 °C. This led to an increase of Si concentration and total radiation losses from the plasma. Surface analysis shows the formation of microcracks and holes on the plasma exposed limiter surface. The released Si was deposited in the vicinity of the tangency point of the limiter. Whereas a Si depletion was observed in the area of highest power loading with values reaching in and in-between fibres values of 0.03% and 0.02% respectively.