Abstract
Measurements were made of emission of secondary electrons and self-reflection of ions from the targets bombarded with 10-25kV accelerated ion beams available in a mass separator. Maximum energies of the secondary electrons were measured in the ion bombardments of Sb+ on Sb, Sb+on Al, Mg+on Mg, and Mg+on Al surfaces. Secondary electron emission coefficients byion bombardment γi and ion self-reflection coefficients(SEEC and ISRC, respectively in the present work)were also obtained with Sb+ and Mg+ beams on various surfaces. These basic data led us to the discussion of the mechanism of secondary electron emission from the surface by ion bombardment in the energy range much higher than H. D. Hagstrum had examined, and further to the discussion of the effects of heavy ions translating and stopping in solid, irrespective of their origins.
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