Abstract
We report here loss of H monitored by on-line elastic recoil detection analysis (ERDA) technique from passivated Hg 1− x Cd x Te (MCT) wafers due to irradiation by 80 MeV Ni 9+, 120 MeV Au 15+ and 200 MeV Ag 10+. The loss of H is more in case of the wafer irradiated by Ag ions as compared to other two because of higher electronic energy loss ( S e). For same S e value, H loss is more in case of the wafer having x = 0.29 as compared to the one having x = 0.204. This is due to higher band gap of the former as compared to the later, which is an important data for proper use of these materials as IR detector in intense radiation zone. These results are explained on the basis of thermal spike model of ion–solid interaction.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
