Abstract

Atomically precise fabrication methods are critical for the development of next-generation technologies. For example, in nanoelectronics based on van der Waals heterostructures, where two-dimensional materials are stacked to form devices with nanometer thicknesses, a major challenge is patterning with atomic precision and individually addressing each molecular layer. Here we demonstrate an atomically thin graphene etch stop for patterning van der Waals heterostructures through the selective etch of two-dimensional materials with xenon difluoride gas. Graphene etch stops enable one-step patterning of sophisticated devices from heterostructures by accessing buried layers and forming one-dimensional contacts. Graphene transistors with fluorinated graphene contacts show a room temperature mobility of 40,000 cm2 V−1 s−1 at carrier density of 4 × 1012 cm−2 and contact resistivity of 80 Ω·μm. We demonstrate the versatility of graphene etch stops with three-dimensionally integrated nanoelectronics with multiple active layers and nanoelectromechanical devices with performance comparable to the state-of-the-art.

Highlights

  • In the current state of the art, the relative ease of assembly of van der Waals (vdW) heterostructures, which occurs through the sequential pickup and stamped release of individual atomic layers, contrasts starkly with the difficulty of patterning and electrically addressing each layer in a heterostructure device

  • The current state-of-the-art method is to use edge contacts where heterostructures are etched through to expose the edges of buried layers of graphene encapsulated in insulating hexagonal boron nitride, and metals are evaporated onto the edge to make one-dimensional (1D) contacts[13]

  • In Supplementary Note 1, Supplementary Figure 1, and Supplementary Table 1, we show that the same process can be applied to many other 2D material heterostructures as well, including hexagonal boron nitride (hBN), MoS2, WSe2, and black phosphorus (BP)

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Summary

Introduction

In the current state of the art, the relative ease of assembly of vdW heterostructures, which occurs through the sequential pickup and stamped release of individual atomic layers, contrasts starkly with the difficulty of patterning and electrically addressing each layer in a heterostructure device. The current state-of-the-art method is to use edge contacts where heterostructures are etched through to expose the edges of buried layers of graphene encapsulated in insulating hexagonal boron nitride (hBN), and metals are evaporated onto the edge to make one-dimensional (1D) contacts[13] This method has led to a dramatic improvement in the mobility and quality of electronic devices because it allows contact to electronic layers that are fully encapsulated and have a minimum of disorder[13,15]. The embedded contacts, which is composed of FG–metal contacts, lead to room temperature carrier mobilities of 40,000 cm[2] V−1 s−1 at carrier density n = 4.0 × 1012 cm−2 and behave as 1D contacts with low contact resistivity of 80 Ω μm, approaching theoretical limits[11,28] This capability enables simple and scalable methods to vertically integrate 2D devices through contacting multiple active layers, interlayer vias, and suspended nanostructures, yet maintains the state-of-the-art performance of fully encapsulated 2D devices

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