Atomic Force Microscopic Study of Commercially Available Implant Abutments

Abstract

Clinical studies have reported a correlation between the surface roughness of implant abutments and the rate of supragingival and subgingival plaque formation. In order to maintain periimplant health, it is important to understand the relationship between abutment surface characteristics and plaque formation. The aim of this study was to use high image resolution imaging techniques for analysis of implant abutment surface topography. Five commercially available implant abutments (Brånemark, Nobel Biocide, AB, Goteborg, Sweden, Astra, Astra Tech AB, Mondal, Sweden, IMZ, Friatec AG, Mannheim, Germany, Steri-Oss, Denar Corp, Anaheim, Calif, USA, and POI, Kyocera Corp, Kyoto, Japan) were visually and quantitatively characterized using an atomic force microscope. Statistical analysis by analysis of variance and Fishers's Protected Least Significant Differences showed significant differences (p < .05) between arithmetic mean deviation values of surface relative to the center plane (Sa). Power spectral density analysis also was effective as a spacing parameter. Sectional profiles measured the exact length, depth, or height of the specific features on the images. Within the limits of this study, the Brånemark, Astra and IMZ abutments displayed turning marks in x direction from the procedure. The Steri-Oss abutment showed smoothest surface among the five abutments tested.