Abstract
Despite important biotic stresses to common bean, Anthracnose (ANT) and Angular Leaf Spot (ALS) can cause losses of up to 80 % and occur in more than 60 countries around the world. Genetic resistance is the most sustainable strategy to manage these diseases. Thus, we aimed to (1) identify new SNP markers associated with ALS and ANT resistance loci in elite common bean lines, and (2) provide a functional characterization of the DNA sequences containing the identified SNP markers. We evaluated 60 inbred lines, under field conditions, which represent the elite germplasm developed by the Embrapa common bean breeding program across 22 years, in terms of severity of the ALS and ANT. The lines were genotyped with 5,398 SNPs. Then, a Mixed Linear Model was run to determine the SNP-trait associations. We observed two-significant marker-trait associations reacting to ANT, both located on chromosome Pv-02. These markers explained 25 % of the phenotypic variation. For ALS, only one significant marker-trait association was observed, which is located in chromosome Pv-10 and explained 19 % of the phenotypic variation. These markers, along with others already used, will be useful to add or keep ANT and ALS resistance loci identified in this work in the new carioca and black seeded cultivars.
Highlights
Anthracnose (ANT), caused by hemibiotrophic fungus Colletotrichum lindemuthianum (Sacc. and Magnus) Briosi and Cavara, is one important fungal pathogen affecting the sustainability of bean production worldwide
We aimed to identify SNP markers associated with Angular Leaf Spot (ALS) and ANT resistance loci using elite inbred lines that represent the Brazilian germplasm of common bean from the two main market classes
Population structure and genomic data After quality control of the marker data, 1,490 informative SNPs were selected for further analyses
Summary
Anthracnose (ANT), caused by hemibiotrophic fungus Colletotrichum lindemuthianum (Sacc. and Magnus) Briosi and Cavara, is one important fungal pathogen affecting the sustainability of bean production worldwide. Anthracnose (ANT), caused by hemibiotrophic fungus Colletotrichum lindemuthianum Magnus) Briosi and Cavara, is one important fungal pathogen affecting the sustainability of bean production worldwide. Mild temperatures and high humidity favor disease development that can lead to a complete crop failure (Trabanco et al, 2015). The pathogen can attack all aerial parts of bean plants and damage can reach up to 100 % yield loss in extreme cases (Singh and Schwartz, 2010). Another important disease affecting common bean crop is the Angular Leaf Spot (ALS), caused by the hemibiotrophic fungus Pseudocercospora griseola (Sacc.) Crous and Braun. Infection and sporulation occur within a broad temperature range, from 10 to 33 °C (Allorent and Savary, 2005)
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