Abstract
Journal Article Artifacts in Neuroimaging - Pitfalls in Volume Electron Microscopy for CLEM and in Freeze-Fracture Replica Immunogold Labeling - Get access Naomi Kamasawa Naomi Kamasawa Electron Microscopy Core Facility, Max Planck Florida Institute for Neuroscience, Jupiter, USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 2062–2063, https://doi.org/10.1017/S1431927616011156 Published: 25 July 2016
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